Datasheet ISL70444SEH (Intersil) - 4

制造商Intersil
描述19MHz Radiation Hardened 40V Quad Rail-to-Rail Input - Output, Low-Power Operational Amplifiers
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修订版2017-12-21
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link. to. page. 4. link. to. page. 4. link. to. page. 4. link. to. page. 4. link. to. page. 4. ISL70444SEH. Ordering. Information. ORDERING/SMD. PART. NUMBER. TEMP. RANGE

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link to page 4 link to page 4 link to page 4 link to page 4 link to page 4 ISL70444SEH Ordering Information ORDERING/SMD PART NUMBER TEMP RANGE PACKAGE PKG. NUMBER (Note 2) (Note 1) (°C) (RoHS Compliant) DWG. # 5962F1321401VXC ISL70444SEHVF -55 to +125 14 Ld Flatpack K14.C N/A ISL70444SEHF/PROTO (Note 3) -55 to +125 14 Ld Flatpack K14.C 5962F1321401V9A ISL70444SEHVX -55 to +125 DIE N/A ISL70444SEHX/SAMPLE (Note 3) -55 to +125 DIE N/A ISL70444SEHEVAL1Z (Note 4) Evaluation Board NOTES: 1. These Intersil Pb-free Hermetic packaged products employ 100% Au plate - e4 termination finish, which is RoHS compliant and compatible with both SnPb and Pb-free soldering operations. 2. Specifications for Rad Hard QML devices are controlled by the Defense Logistics Agency Land and Maritime (DLA). The SMD numbers listed must be used when ordering. 3. The /PROTO and /SAMPLE are not rated or certified for Total Ionizing Dose (TID) or Single Event Effect (SEE) immunity. These parts are intended for engineering evaluation purposes only. The /PROTO parts meet the electrical limits and conditions across the temperature range specified in the DLA SMD and are in the same form and fit as the qualified device. The /SAMPLE die is capable of meeting the electrical limits and conditions specified in the DLA SMD at +25°C only. The /SAMPLE is a die and does not receive 100% screening across the temperature range to the DLA SMD electrical limits. These part types do not come with a certificate of conformance because there is no radiation assurance testing and they are not DLA qualified devices. 4. The evaluation board uses /PROTO parts. The /PROTO parts are not rated or certified for Total Ionizing Dose (TID) or Single Event Effect (SEE) immunity. FN8411 Rev.4.00 Page 4 of 25 Jul 6, 2017 Document Outline Related Literature Features Applications Table of Contents Pin Configuration Pin Descriptions Ordering Information Absolute Maximum Ratings Thermal Information Recommended Operating Conditions Electrical Specifications VS = ±18V Electrical Specifications VS = ±2.5V Electrical Specifications VS = ±1.5V Electrical Specifications VS = ±18V - Post Radiation Electrical Specifications VS = ±2.5V - Post Radiation Electrical Specifications VS = ±1.5V - Post Radiation Typical Performance Curves Post High Dose Rate Radiation Characteristics Post Low Dose Rate Radiation Characteristics Applications Information Functional Description Operating Voltage Range Input Performance Input ESD Diode Protection Output Short-Circuit Current Limiting Output Phase Reversal Power Dissipation Unused Channel Configuration Die Characteristics Die Dimensions Interface Materials Glassivation Top Metallization Backside Finish Process Assembly Related Information Substrate Potential Additional Information Worst Case Current Density Transistor Count Weight of Packaged Device Lid Characteristics Metallization Mask Layout Revision History About Intersil Package Outline Drawing