Datasheet Texas Instruments SN74CBTLV3253DG4 — 数据表

低压双路1-of-4 FET多路复用器/多路解复用器16-SOIC -40至85

数据表

PDF, 1.5 Mb, 修订版: I, 档案已发布: Sep 30, 2015

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Lifecycle Status	Active (Recommended for new designs)
Manufacture's Sample Availability	No

Additional Features	Powered off protection
Bandwidth	200 MHz
Bandwidth(Max)	200 MHz
Configuration	4:1
ESD Charged Device Model	1 kV
ESD HBM	2 kV
Input/Ouput Voltage(Max)	3.6 V
Input/Output Continuous Current(Max)	128 mA
Input/Output OFF-state Capacitance(Typ)	5.5 pF
Number of Channels	2
OFF-state leakage current(Max)	1 µA
ON-state leakage current(Max)	1 µA
Operating Temperature Range	-40 to 85 C
Package Group	SOIC
Package Size: mm2:W x L	16SOIC: 59 mm2: 6 x 9.9(SOIC) PKG
Rating	Catalog
Ron(Max)	40 Ohms
Ron(Typ)	5 Ohms
Supply Current(Max)	10 uA
Supply Range	3.6 Max
VIH(Min)	2 V
VIL(Max)	0.8 V
Vdd(Max)	3.6 V
Vdd(Min)	2.3 V
Vss(Max)	N/A V
Vss(Min)	N/A V

RoHS

Compliant

Evaluation Modules & Boards: EVMX777BG-01-00-00
J6Entry, RSP and TDA2E-17 CPU Board Evaluation Module
Lifecycle Status: Active (Recommended for new designs)
Evaluation Modules & Boards: EVMX777G-01-20-00
J6Entry/RSP Infotainment (CPU+Display+JAMR3) Evaluation Module
Lifecycle Status: Active (Recommended for new designs)

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Bus FET Switch Solutions for Live Insertion Applications
PDF, 300 Kb, 档案已发布: Feb 7, 2003
In today?s competitive computing and networking industry, any equipment downtime due to component interconnects or bus failures impedes communication, hinders productivity and hampers financial growth. In recognizing this increasingly costly unplanned downtime, the industry introduced live-insertion technology to minimize the impact of any such failures. The live-insertion feature enables a networ

系列: SN74CBTLV3253 (15)