Datasheet ZXRE250, ZXRE252 (Diodes) - 3
| 制造商 | Diodes |
| 描述 | Very Low Cathode Current adjustable Precision Shunt Regulator |
| 页数 / 页 | 12 / 3 — ZXRE250 / ZXRE252. Electrical Characteristics. Test Circuits. Figure 2 … |
| 文件格式/大小 | PDF / 747 Kb |
| 文件语言 | 英语 |
ZXRE250 / ZXRE252. Electrical Characteristics. Test Circuits. Figure 2 Test Circuit for VKA > VREF
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ZXRE250 / ZXRE252 Electrical Characteristics
(continued) (@TA = +25°C, unless otherwise specified.) The average temperature coefficient of the reference input voltage αVREF is defined as: Vmax V DEV X 106 X 10 α V @ 25 @ º 25 C αV REF V ppm/ºC REF = T2 – 2 T1 Vmin Where: T2 - T1 = full temperature change. αV V = V max - Vmin REF can be positive or negative depending on whether the slope is DEV DE positive or negative. Note : 8. The dynamic output impedance, RZ, is defined as: ΔV Δ KA Z = T1 T2 KA Tem e per m at per ur at e ur ΔI Δ KA When the device is programmed with two external resistors R1 and R2, the dynamic output impedance of the overall circuit, is defined as: ΔV Δ R1 Z’ = ≈ Z 1 + = ≈ Δ Z I KA ΔI Δ R2
Test Circuits Figure 2 Test Circuit for VKA > VREF Figure 1 Test Circuit for VKA = VREF Figure 3 Test Circuit for IOFF
ZXRE250 / ZXRE252 3 of 12 June 2018 Document number: DS35228 Rev. 7 - 3
www.diodes.com
© Diodes Incorporated Document Outline Pin Assignments Description Features Applications (2) Package Type: SOT23 (2) Package Types: SOT23
(continued) (@TA = +25°C, unless otherwise specified.) The average temperature coefficient of the reference input voltage αVREF is defined as: Vmax V DEV X 106 X 10 α V @ 25 @ º 25 C αV REF V ppm/ºC REF = T2 – 2 T1 Vmin Where: T2 - T1 = full temperature change. αV V = V max - Vmin REF can be positive or negative depending on whether the slope is DEV DE positive or negative. Note : 8. The dynamic output impedance, RZ, is defined as: ΔV Δ KA Z = T1 T2 KA Tem e per m at per ur at e ur ΔI Δ KA When the device is programmed with two external resistors R1 and R2, the dynamic output impedance of the overall circuit, is defined as: ΔV Δ R1 Z’ = ≈ Z 1 + = ≈ Δ Z I KA ΔI Δ R2
Test Circuits Figure 2 Test Circuit for VKA > VREF Figure 1 Test Circuit for VKA = VREF Figure 3 Test Circuit for IOFF
ZXRE250 / ZXRE252 3 of 12 June 2018 Document number: DS35228 Rev. 7 - 3
www.diodes.com
© Diodes Incorporated Document Outline Pin Assignments Description Features Applications (2) Package Type: SOT23 (2) Package Types: SOT23