Datasheet BAS116 (Nexperia) - 5

制造商Nexperia
描述Low-leakage diode
页数 / 页10 / 5 — Nexperia. BAS116. Low-leakage diode. 11. Test information. Fig. 6. …
修订版05082020
文件格式/大小PDF / 205 Kb
文件语言英语

Nexperia. BAS116. Low-leakage diode. 11. Test information. Fig. 6. Reverse recovery time test circuit and waveforms

Nexperia BAS116 Low-leakage diode 11 Test information Fig 6 Reverse recovery time test circuit and waveforms

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Nexperia BAS116 Low-leakage diode 11. Test information
tr tp t D.U.T. 10 % + I R F trr S = 50 Ω IF SAMPLING t OSCILLOSCOPE V = VR + IF × RS Ri = 50 Ω (1) 90 % VR mga881 input signal output signal (1) IR = 1 mA
Fig. 6. Reverse recovery time test circuit and waveforms Quality information
This product has been qualified in accordance with the Automotive Electronics Council (AEC) standard Q101 - Stress test qualification for discrete semiconductors, and is suitable for use in automotive applications. BAS116 All information provided in this document is subject to legal disclaimers. © Nexperia B.V. 2020. Al rights reserved
Product data sheet 5 August 2020 5 / 10
Document Outline 1. General description 2. Features and benefits 3. Applications 4. Quick reference data 5. Pinning information 6. Ordering information 7. Marking 8. Limiting values 9. Thermal characteristics 10. Characteristics 11. Test information 12. Package outline 13. Soldering 14. Revision history 15. Legal information Contents