Datasheet ADL5304 (Analog Devices) - 13
| 制造商 | Analog Devices |
| 描述 | High Speed, 200 dB Range, Current to Voltage Logarithmic Converter |
| 页数 / 页 | 32 / 13 — Data Sheet. ADL5304. TEST CIRCUITS. KEITHLEY 236 SMU SOURCE CURRENT. … |
| 修订版 | A |
| 文件格式/大小 | PDF / 924 Kb |
| 文件语言 | 英语 |
Data Sheet. ADL5304. TEST CIRCUITS. KEITHLEY 236 SMU SOURCE CURRENT. MEASURE VOLTAGE. AGILENT 34970A. DATA ACQUISITION UNIT. VSUM
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Data Sheet ADL5304 TEST CIRCUITS KEITHLEY 236 SMU SOURCE CURRENT MEASURE VOLTAGE AGILENT 34970A DATA ACQUISITION UNIT VSUM KEITHLEY 236 SMU VPOS SOURCE CURRENT VNEG MEASURE VOLTAGE 1P5V 2VLT IMON VNUM INNM 1P5V BSDC 2VLT VPOS DCBI 30 32 31 26 28 17 29 27 INPS 1.5V 24 2V MONITOR AND PD BIAS INMS VSM1 100nA BIAS AND 23 2 (1.1× INUM) VREF VSM2 1.5V VLOG 3 22 ADL5304 INUM 4 SCL1 VNUM ILOG 21 IDEN 5kΩ 5kΩ 5 TEMPERATURE SCL2 20 COMPENSATION IREF 7.5kΩ 6 19 SCL3 VDEN VSM3 7 ACOM 18 VSM4 1.5V 8 COMM NMFS VNEG DNFS ACOM HFCP 9 10 11 12 13 14 15 16 VDEN INDN 1kΩ 1kΩ 0.1µF
038
0.1µF VNEG
09459- Figure 38. Setup for Measuring Logarithmic/Slope/Offset Conformance
HP3577B NETWORK ANALYZER OUTPUT INPUT R INPUT A AD8138 J1 J3 EVALUATION BOARD 50Ω MODIFIED TO PROVIDE 50Ω DC OFFSET INPUT HP11667B J2 J4 SPLITTER IMON VNUM INNM 1P5V BSDC 2VLT VPOS DCBI 30 32 31 26 28 17 29 27 INPS 1.5V 24 2V MONITOR AND PD BIAS INMS VSM1 100nA BIAS AND 23 2 (1.1× INUM) VREF VSM2 1.5V VLOG 3 22 1kΩ TO 10MΩ TO SET ADL5304 CURRENT INUM 4 SCL1 VNUM ILOG 21 50Ω IDEN 5kΩ 5kΩ TERM 5 TEMPERATURE SCL2 20 COMPENSATION 7.5kΩ 6 IREF 19 SCL3 VDEN 7 ACOM VSM3 18 1.5V 8 COMM NMFS VNEG DNFS ACOM HFCP VSM4 9 10 11 12 13 14 15 16 VDEN INDN 1kΩ 1kΩ 0.1µF
039
0.1µF VNEG
09459- Figure 39. Setup for Measuring Bandwidth Rev. A | Page 13 of 32 Document Outline FEATURES APPLICATIONS GENERAL DESCRIPTION SIMPLIFIED BLOCK DIAGRAM TABLE OF CONTENTS REVISION HISTORY SPECIFICATIONS ABSOLUTE MAXIMUM RATINGS ESD CAUTION PIN CONFIGURATION AND FUNCTION DESCRIPTIONS TYPICAL PERFORMANCE CHARACTERISTICS TEST CIRCUITS TERMINOLOGY THEORY OF OPERATION BASIC CONCEPTS OPTICAL MEASUREMENTS Decibel Scaling CIRCUIT DESCRIPTION Bandwidth vs. Current Noise vs. Current Filtering to Improve Noise and Dynamic Behavior Photodiode Bias Reference Outputs Buffer Amplifier Setting the Log Slope and Intercept Slope Inversion Log Ratio Operation APPLICATIONS INFORMATION USING THE ADL5304 Using the Adaptive Bias Summing Node Voltage Leakage VLOG Output Dynamic Response USING A NEGATIVE SUPPLY EVALUATION BOARD SCHEMATIC AND SILKSCREENS OUTLINE DIMENSIONS ORDERING GUIDE
038
0.1µF VNEG
09459- Figure 38. Setup for Measuring Logarithmic/Slope/Offset Conformance
HP3577B NETWORK ANALYZER OUTPUT INPUT R INPUT A AD8138 J1 J3 EVALUATION BOARD 50Ω MODIFIED TO PROVIDE 50Ω DC OFFSET INPUT HP11667B J2 J4 SPLITTER IMON VNUM INNM 1P5V BSDC 2VLT VPOS DCBI 30 32 31 26 28 17 29 27 INPS 1.5V 24 2V MONITOR AND PD BIAS INMS VSM1 100nA BIAS AND 23 2 (1.1× INUM) VREF VSM2 1.5V VLOG 3 22 1kΩ TO 10MΩ TO SET ADL5304 CURRENT INUM 4 SCL1 VNUM ILOG 21 50Ω IDEN 5kΩ 5kΩ TERM 5 TEMPERATURE SCL2 20 COMPENSATION 7.5kΩ 6 IREF 19 SCL3 VDEN 7 ACOM VSM3 18 1.5V 8 COMM NMFS VNEG DNFS ACOM HFCP VSM4 9 10 11 12 13 14 15 16 VDEN INDN 1kΩ 1kΩ 0.1µF
039
0.1µF VNEG
09459- Figure 39. Setup for Measuring Bandwidth Rev. A | Page 13 of 32 Document Outline FEATURES APPLICATIONS GENERAL DESCRIPTION SIMPLIFIED BLOCK DIAGRAM TABLE OF CONTENTS REVISION HISTORY SPECIFICATIONS ABSOLUTE MAXIMUM RATINGS ESD CAUTION PIN CONFIGURATION AND FUNCTION DESCRIPTIONS TYPICAL PERFORMANCE CHARACTERISTICS TEST CIRCUITS TERMINOLOGY THEORY OF OPERATION BASIC CONCEPTS OPTICAL MEASUREMENTS Decibel Scaling CIRCUIT DESCRIPTION Bandwidth vs. Current Noise vs. Current Filtering to Improve Noise and Dynamic Behavior Photodiode Bias Reference Outputs Buffer Amplifier Setting the Log Slope and Intercept Slope Inversion Log Ratio Operation APPLICATIONS INFORMATION USING THE ADL5304 Using the Adaptive Bias Summing Node Voltage Leakage VLOG Output Dynamic Response USING A NEGATIVE SUPPLY EVALUATION BOARD SCHEMATIC AND SILKSCREENS OUTLINE DIMENSIONS ORDERING GUIDE