Datasheet ADIS16334 (Analog Devices)

制造商Analog Devices
描述Low Profile, Six Degrees of Freedom Inertial Sensor
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修订版D
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Low Profile. Six Degree of Freedom Inertial Sensor. Data Sheet. ADIS16334. FEATURES. GENERAL DESCRIPTION

Datasheet ADIS16334 Analog Devices, 修订版: D

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Low Profile Six Degree of Freedom Inertial Sensor Data Sheet ADIS16334 FEATURES GENERAL DESCRIPTION Triaxis digital gyroscope with digital range scaling
The ADIS16334 iSensor® is a complete inertial system that includes
±75°/sec, ±150°/sec, ±300°/sec settings
a triaxis gyroscope and triaxis accelerometer. Each sensor in the
Tight orthogonal alignment: <0.05°
ADIS16334 combines industry-leading iMEMS® technology
Triaxis digital accelerometer: ±5 g
with signal conditioning that optimizes dynamic performance.
Wide sensor bandwidth: 330 Hz
The factory calibration characterizes each sensor for sensitivity,
Autonomous operation and data collection
bias, alignment, and linear acceleration (gyro bias). As a result,
No external configuration commands required
each sensor has its own dynamic compensation formulas that
Start-up time: 180 ms
provide accurate sensor measurements over a temperature
Factory-calibrated sensitivity, bias, and axial alignment
range of −20°C to +70°C.
Calibration temperature range: −20°C to +70°C
The ADIS16334 provides a simple, cost-effective method for
SPI-compatible serial interface
integrating accurate, multiaxis, inertial sensing into industrial
Embedded temperature sensor
systems, especially when compared with the complexity and
Programmable operation and control
investment associated with discrete designs. All necessary motion
Automatic and manual bias correction controls
testing and calibration are part of the production process at the
Bartlett window FIR filter length, number of taps
factory, greatly reducing system integration time. Tight orthogonal
Digital I/O: data ready, alarm indicator, general-purpose
alignment simplifies inertial frame alignment in navigation systems.
Alarms for condition monitoring
An improved SPI interface and register structure provide faster
Enable external sample clock input: up to 1.2 kHz
data col ection and configuration control.
Single-command self-test Single-supply operation: 4.75 V to 5.25 V
This compact module is approximately 24 mm × 33 mm × 11 mm
2000 g shock survivability
and provides a compact connector interface.
24 mm × 33 mm × 11 mm module with connector interface Operating temperature range: −40°C to +105°C APPLICATIONS Medical instrumentation Robotics Platform controls Navigation FUNCTIONAL BLOCK DIAGRAM DIOx RST VCC POWER SELF-TEST I/O ALARMS GND MANAGEMENT TRIAXIAL CONTROLLER ACCEL CONTROL CS REGISTERS SCLK SPI TRIAXIAL PORT DIN GYRO DIGITAL CALIBRATION OUTPUT DOUT FILTER CORRECTION REGISTERS TEMP
001
ADIS16334
09362- Figure 1.
Rev. B Document Feedback Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 ©2011–2013 Analog Devices, Inc. All rights reserved. license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners. Technical Support www.analog.com
Document Outline Features Applications General Description Functional Block Diagram Revision History Specifications Timing Specifications Timing Diagrams Absolute Maximum Ratings ESD Caution Pin Configuration and Function Descriptions Typical Performance Characteristics Theory of Operation Gyroscopes Accelerometers Data Sampling and Processing Calibration User Interface SPI Interface Basic Operation Reading Sensor Data Burst Read Function Memory Map Output Data Registers Gyroscopes Accelerometers Internal Temperature Measurements Device Configuration Dual Memory Structure Digital Processing Configuration Sample Rate Input Clock Configuration Digital Filtering Dynamic Range Optimizing Accuracy Automatic Bias Correction Manual Bias Correction Restoring Factory Calibration Point-of-Percussion/Linear-g Compensation System Tools Global Commands General-Purpose I/O Data Ready I/O Indicator Self-Test Memory Test Status Device Identification Flash Memory Management Alarms Static Alarm Use Dynamic Alarm Use Alarm Reporting Alarm Example Applications Information ADIS16334/PCBZ Installation Mounting Approaches Outline Dimensions Ordering Guide