Datasheet ADIS16470 (Analog Devices) - 30

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Data Sheet. ADIS16470. Bias Correction Update. Product Identification (PROD_ID). Table 116. PROD_ID Register Definition

Data Sheet ADIS16470 Bias Correction Update Product Identification (PROD_ID) Table 116 PROD_ID Register Definition

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Data Sheet ADIS16470 Bias Correction Update Product Identification (PROD_ID)
Use the following DIN pin sequence to set Register GLOB_CMD,
Table 116. PROD_ID Register Definition
Bit 0 = 1 to trigger a bias correction, using the correction factors
Addresses Default Access Flash Backup
from the CBE (see Table 107): 0xE801, 0xE900. 0x72, 0x73 0x4056 R No
Firmware Revision (FIRM_REV) Table 117. PROD_ID Bit Definitions Table 110. FIRM_REV Register Definition Bits Description Addresses Default Access Flash Backup
[15:0] Product identification = 0x4056 0x6C, 0x6D Not applicable R Yes The PROD_ID register (see Table 116 and Table 117) contains
Table 111. FIRM_REV Bit Definitions
the numerical portion of the device number (16,470). See Figure 28
Bits Description
for an example of how to use a looping read of this register to [15:0] Firmware revision, binary coded decimal (BCD) format validate the integrity of the communication. The FIRM_REV register (see Table 110 and Table 111) provides
Serial Number (SERIAL_NUM)
the firmware revision for the internal firmware. This register
Table 118. SERIAL_NUM Register Definition
uses a BCD format, where each nibble represents a digit. For
Addresses Default Access Flash Backup
example, if FIRM_REV = 0x0104, the firmware revision is 1.04. 0x74, 0x75 Not applicable R Yes
Firmware Revision Day and Month (FIRM_DM) Table 119. SERIAL_NUM Bit Definitions Table 112. FIRM_DM Register Definition Bits Description Addresses Default Access Flash Backup
[15:0] Lot specific serial number 0x6E, 0x6F Not applicable R Yes
Scratch Registers (USER_SCR_1 to USER_SER_3) Table 113. FIRM_DM Bit Definitions Bits Description Table 120. USER_SCR_1 Register Definition Addresses Default Access Flash Backup
[15:8] Factory configuration month, BCD format [7:0] Factory configuration day, BCD format 0x76, 0x77 Not applicable R/W Yes The FIRM_DM register (see Table 112 and Table 113)
Table 121. USER_SCR_1 Bit Definitions
contains the month and day of the factory configuration date.
Bits Description
Register FIRM_DM, Bits[15:8] contains digits that represent the [15:0] User defined month of the factory configuration. For example, November is the 11th month in a year and is represented by Register FIRM_DM,
Table 122. USER_SCR_2 Register Definition
Bits[15:8] = 0x11. Register FIRM_DM, Bits[7:0] contains the
Addresses Default Access Flash Backup
day of factory configuration. For example, the 27th day of the 0x78, 0x79 Not applicable R/W Yes month is represented by Register FIRM_DM, Bits[7:0] = 0x27.
Table 123. USER_SCR_2 Bit Definitions Firmware Revision Year (FIRM_Y) Bits Description Table 114. FIRM_Y Register Definition
[15:0] User defined
Addresses Default Access Flash Backup Table 124. USER_SCR_3 Register Definition
0x70, 0x71 Not applicable R Yes
Addresses Default Access Flash Backup Table 115. FIRM_Y Bit Definitions
0x7A, 0x7B Not applicable R/W Yes
Bits Description Table 125. USER_SCR_3 Bit Definitions
[15:0] Factory configuration year, BCD format
Bits Description
The FIRM_Y register (see Table 114 and Table 115) contains the [15:0] User defined year of the factory configuration date. For example, the year, The USER_SCR_1 (see Table 120 and Table 121), USER_SCR_2 2017, is represented by FIRM_Y = 0x2017. (see Table 122 and Table 123), and USER_SCR_3 (see Table 124 and Table 125) registers provide three locations for users to store information. For nonvolatile storage, use the manual flash memory update command (Register GLOB_CMD, Bit 3, see Table 109), after writing information to these registers. Rev. A | Page 29 of 34 Document Outline FEATURES APPLICATIONS GENERAL DESCRIPTION FUNCTIONAL BLOCK DIAGRAM REVISION HISTORY SPECIFICATIONS TIMING SPECIFICATIONS Timing Diagrams ABSOLUTE MAXIMUM RATINGS THERMAL RESISTANCE ESD CAUTION PIN CONFIGURATION AND FUNCTION DESCRIPTIONS TYPICAL PERFORMANCE CHARACTERISTICS THEORY OF OPERATION INTRODUCTION INERTIAL SENSOR SIGNAL CHAIN Gyroscope Data Sampling Accelerometer Data Sampling External Clock Options Inertial Sensor Calibration Bartlett Window FIR Filter Averaging/Decimating Filter REGISTER STRUCTURE SERIAL PERIPHERAL INTERFACE (SPI) DATA READY (DR) READING SENSOR DATA Burst Read Function DEVICE CONFIGURATION Memory Structure USER REGISTER MEMORY MAP USER REGISTER DEFINTIONS Status/Error Flag Indicators (DIAG_STAT) GYROSCOPE DATA Gyroscope Data Formatting X-Axis Gyroscope (X_GYRO_LOW and X_GYRO_OUT) Y-Axis Gyroscope (Y_GYRO_LOW and Y_GYRO_OUT) Z-Axis Gyroscope (Z_GYRO_LOW and Z_GYRO_OUT) Acceleration Data Accelerometer Resolution X-Axis Accelerometer (X_ACCL_LOW and X_ACCL_OUT) Y-Axis Accelerometer (Y_ACCL_LOW and Y_ACCL_OUT) Z-Axis Accelerometer (Z_ACCL_LOW and Z_ACCL_OUT) Internal Temperature (TEMP_OUT) Time Stamp (TIME_STAMP) Data Update Counter (DATA_CNTR) DELTA ANGLES X-Axis Delta Angle (X_DELTANG_LOW and X_DELTANG_OUT) Y-Axis Delta Angle (Y_DELTANG_LOW and Y_DELTANG_OUT) Z-Axis Delta Angle (Z_DELTANG_LOW and Z_DELTANG_OUT) Delta Angle Resolution DELTA VELOCITY X-Axis Delta Velocity (X_DELTVEL_LOW and X_DELTVEL_OUT) Y-Axis Delta Velocity (Y_DELTVEL_LOW and Y_DELTVEL_OUT) Z-Axis Delta Velocity (Z_DELTVEL_LOW and Z_DELTVEL_OUT) Delta Velocity Resolution CALIBRATION Calibration, Gyroscope Bias (XG_BIAS_LOW and XG_BIAS_HIGH) Calibration, Gyroscope Bias (YG_BIAS_LOW and YG_BIAS_HIGH) Calibration, Gyroscope Bias (ZG_BIAS_LOW and ZG_BIAS_HIGH) Calibration, Accelerometer Bias (XA_BIAS_LOW and XA_BIAS_HIGH) Calibration, Accelerometer Bias (YA_BIAS_LOW and YA_BIAS_HIGH) Calibration, Accelerometer Bias (ZA_BIAS_LOW and ZA_BIAS_HIGH) Filter Control Register (FILT_CTRL) Miscellaneous Control Register (MSC_CTRL) Point of Percussion Linear Acceleration Effect on Gyroscope Bias Internal Clock Mode Output Sync Mode Direct Sync Mode Pulse Sync Mode Scaled Sync Mode Decimation Filter (DEC_RATE) Data Update Rate in External Sync Modes Continuous Bias Estimation (NULL_CNFG) Global Commands (GLOB_CMD) Software Reset Flash Memory Test Flash Memory Update Self Test Factory Calibration Restore Bias Correction Update Firmware Revision (FIRM_REV) Firmware Revision Day and Month (FIRM_DM) Firmware Revision Year (FIRM_Y) Product Identification (PROD_ID) Serial Number (SERIAL_NUM) Scratch Registers (USER_SCR_1 to USER_SER_3) Flash Memory Endurance Counter (FLSHCNT_LOW and FLSHCNT_HIGH) APPLICATIONS INFORMATION ASSEMBLY AND HANDLING TIPS Package Attributes Assembly Tips PCB Layout Suggestions Underfill Process Validation and Control POWER SUPPLY CONSIDERATIONS EVALUATION TOOLS Breakout Board PC-Based Evaluation, EVAL-ADIS2 PACKAGING AND ORDERING INFORMATION OUTLINE DIMENSIONS ORDERING GUIDE