Datasheet Analog Devices OP467S — 数据表

REVISIONS
LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Change to the supply current test, ICC, in table I. Update boilerplate. -rrp 99-11-16 R. MONNIN B Add radiation hardness requirements. Add case outline D. Add table IIB. -rrp 00-05-05 R. MONNIN C Add footnote to the supply voltage test in section 1.3. Add footnote to the
supply current and power supply rejection ratio test in table I. Update
boilerplate. – rrp 01-10-17 R. MONNIN D Change to the post irradiation test limits in table I for IIO, IIB, AVO, and ICC.
Removed accelerated aging and dose rate burnout provisions in
section 4. – rrp 01-11-15 R. MONNIN E Added subgroup 4 to table IIA under group E end-point for device class V. – gt 03-03-11 R. MONNIN F Drawing updated to reflect current requirements. -rrp 05-09-07 R. MONNIN G Delete footnote 2/ from section 1.3. Delete footnote 5/ from Table I.
These footnotes were incorrectly added under revision C. -ro 10-04-22 C. SAFFLE H Add footnote 4/ to the Large signal voltage gain (AVO) test under the condition
column with VCC = 5 V as specified in Table I. Delete figure 2 radiation
exposure circuit. Make change to paragraph 3.2.3. -ro 14-12-08 C.SAFFLE 15-04-08 C. SAFFLE Delete footnote 4/ from the Output voltage swing test under the condition J column with VCC = 15 V as specified in Table I. -ro REV
SHEET
REV
SHEET
REV STATUS REV J J J J J J J J J J J OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY
RICK C. OFFICER STANDARD
MICROCIRCUIT
DRAWING DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
http://www.landandmaritime.dla.mil CHECKED BY
RAJESH R. PITHADIA
APPROVED BY THIS DRAWING IS AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE …