Datasheet Texas Instruments SN74BCT8374ADW — 数据表

制造商Texas Instruments
系列SN74BCT8374A
零件号SN74BCT8374ADW
Datasheet Texas Instruments SN74BCT8374ADW

带有八通道D型边缘触发触发器24-SOIC的扫描测试设备0至70

数据表

Scan Test Devices With Octal D-Type Edge-Triggered Flip-Flops datasheet
PDF, 435 Kb, 修订版: E, 档案已发布: Jul 1, 1996
从文件中提取

价格

状态

Lifecycle StatusActive (Recommended for new designs)
Manufacture's Sample AvailabilityNo

打包

Pin24
Package TypeDW
Industry STD TermSOIC
JEDEC CodeR-PDSO-G
Package QTY25
CarrierTUBE
Device MarkingBCT8374A
Width (mm)7.5
Length (mm)15.4
Thickness (mm)2.35
Pitch (mm)1.27
Max Height (mm)2.65
Mechanical Data下载

参数化

Bits8
F @ Nom Voltage(Max)70 Mhz
ICC @ Nom Voltage(Max)52 mA
Operating Temperature Range0 to 70 C
Output Drive (IOL/IOH)(Max)64/-15 mA
Package GroupSOIC
Package Size: mm2:W x L24SOIC: 160 mm2: 10.3 x 15.5(SOIC) PKG
RatingCatalog
Technology FamilyBCT
VCC(Max)5.5 V
VCC(Min)4.5 V
Voltage(Nom)5 V
tpd @ Nom Voltage(Max)10 ns

生态计划

RoHSCompliant

应用须知

  • Programming CPLDs Via the 'LVT8986 LASP
    PDF, 819 Kb, 档案已发布: Nov 1, 2005
    This application report summarizes key information required for understanding the 'LVT8986 linking addressable scan ports (LASPs) multidrop addressable IEEE Std 1149.1 (JTAG) test access port (TAP) transceiver. This report includes information about the 'LVT8986 secondary TAPs, bypass and linking shadow protocol, scan-path description languages, serial vector format files, and an example of how to

模型线

系列: SN74BCT8374A (1)
  • SN74BCT8374ADW

制造商分类

  • Semiconductors > Logic > Specialty Logic > Boundary Scan (JTAG) Logic