Datasheet Texas Instruments SN74BCT8374ADW — 数据表
| 制造商 | Texas Instruments |
| 系列 | SN74BCT8374A |
| 零件号 | SN74BCT8374ADW |
带有八通道D型边缘触发触发器24-SOIC的扫描测试设备0至70
数据表
Scan Test Devices With Octal D-Type Edge-Triggered Flip-Flops datasheet
PDF, 435 Kb, 修订版: E, 档案已发布: Jul 1, 1996
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应用须知
- Programming CPLDs Via the 'LVT8986 LASPPDF, 819 Kb, 档案已发布: Nov 1, 2005
This application report summarizes key information required for understanding the 'LVT8986 linking addressable scan ports (LASPs) multidrop addressable IEEE Std 1149.1 (JTAG) test access port (TAP) transceiver. This report includes information about the 'LVT8986 secondary TAPs, bypass and linking shadow protocol, scan-path description languages, serial vector format files, and an example of how to
模型线
系列: SN74BCT8374A (1)
- SN74BCT8374ADW
制造商分类
- Semiconductors > Logic > Specialty Logic > Boundary Scan (JTAG) Logic