Datasheet Texas Instruments DAC38RF93IAAVR — 数据表
| 制造商 | Texas Instruments |
| 系列 | DAC38RF93 |
| 零件号 | DAC38RF93IAAVR |
双通道，14位，9-GSPS，12x-24x内插，6和9 GHz PLL数模转换器（DAC）144-FCBGA -40至85
数据表
DAC38RFxx Dual- or Single-Channel, Single-Ended or Differential Output, 14-Bit, 9-GSPS, RF-Sampling DAC With JESD204B Interface and On-Chip PLL datasheet
PDF, 3.7 Mb, 修订版: C, 档案已发布: Jul 31, 2017
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应用须知
- DAC38RF8x Test ModesPDF, 3.0 Mb, 档案已发布: Jul 25, 2017
The DAC38RF8x family of devices comes equipped with multiple test modes to assist users in verifying systems in rapid prototyping situations. This application report covers two of the available tests, the pseudorandom binary-sequence test and JESD204B short pattern test, in detail using the TI DAC38RF8xEVM and TSW14J56EVM capture card. - Quick-Start Methods in Simulating the DAC38RF8x Input/Output Buffer InformationPDF, 600 Kb, 档案已发布: Aug 2, 2017
Input/output Buffer Information Specification (IBIS) models are used to simulate digital electrical interfaces.These models can be categorized into two main categories: traditional and algorithmic modeling interface(AMI). AMI is typically used for SerDes channel simulation, and is different from the traditional IBIS model,which is the focus of this document. These models are simple ASCII tex - Eye Scan Testing with the DAC38RFxxPDF, 3.6 Mb, 档案已发布: Aug 10, 2017
The DAC38RFxx family of devices comes equipped with the capability to generate eye diagrams by usinging JTAG communication with the DAC38RF8x eye scan GUI software. By running this software, users can generate eye diagrams to compare with the JESD204B standard eye mask requirements, and verify signal integrity performance of the SerDes link between DAC and FPGA/ASIC. This application report descri
模型线
系列: DAC38RF93 (2)
- DAC38RF93IAAV DAC38RF93IAAVR
制造商分类
- Semiconductors > Data Converters > Digital-to-Analog Converters (DACs) > High Speed DACs (>10MSPS)