Datasheet Texas Instruments ADS5463 — 数据表

制造商Texas Instruments
系列ADS5463
Datasheet Texas Instruments ADS5463

12位500MSPS模数转换器(ADC)

数据表

12-Bit 500-/550-MSPS Analog-to-Digital Converters datasheet
PDF, 2.0 Mb, 修订版: E, 档案已发布: Jul 1, 2009
从文件中提取

价格

状态

ADS5463IPFPADS5463IPFPG4ADS5463IPFPR
Lifecycle StatusActive (Recommended for new designs)Active (Recommended for new designs)Active (Recommended for new designs)
Manufacture's Sample AvailabilityNoNoNo

打包

ADS5463IPFPADS5463IPFPG4ADS5463IPFPR
N123
Pin808080
Package TypePFPPFPPFP
Industry STD TermHTQFPHTQFPHTQFP
JEDEC CodeS-PQFP-GS-PQFP-GS-PQFP-G
Package QTY961000
CarrierJEDEC TRAY (5+1)LARGE T&R
Device MarkingADS5463IADS5463I
Width (mm)121212
Length (mm)121212
Thickness (mm)111
Pitch (mm).5.5.5
Max Height (mm)1.21.21.2
Mechanical Data下载下载下载

参数化

Parameters / ModelsADS5463IPFP
ADS5463IPFP
ADS5463IPFPG4
ADS5463IPFPG4
ADS5463IPFPR
ADS5463IPFPR
# Input Channels111
Analog Input BW, MHz20002000
Analog Input BW(MHz)2000
Approx. Price (US$)147.13 | 1ku
ArchitecturePipelinePipelinePipeline
DNL(Max), +/-LSB0.950.95
DNL(Max)(+/-LSB)0.95
DNL(Typ), +/-LSB0.250.25
ENOB, Bits10.510.5
ENOB(Bits)10.5
INL(Max), +/-LSB2.52.5
INL(Max)(+/-LSB)1.5
INL(Typ), +/-LSB0.80.8
Input BufferYesYesYes
Input Range, Vp-p2.22.2V (p-p)2.2
InterfaceParallel LVDSParallel LVDSParallel LVDS
Operating Temperature Range, C-40 to 85-40 to 85
Package GroupHTQFPHTQFPHTQFP
Package Size: mm2:W x L, PKG80HTQFP: 196 mm2: 14 x 14(HTQFP)80HTQFP: 196 mm2: 14 x 14(HTQFP)
Package Size: mm2:W x L (PKG)80HTQFP: 196 mm2: 14 x 14(HTQFP)
Power Consumption(Typ), mW22502250
Power Consumption(Typ)(mW)2250
RatingCatalogCatalogCatalog
Reference ModeExt,IntExt
Int
Ext,Int
Resolution, Bits1212
Resolution(Bits)12
SFDR, dB8282
SFDR(dB)82
SINAD, dB64.164.1
SINAD(dB)64.1
SNR, dB65.365.3
SNR(dB)65.3
Sample Rate(Max), MSPS500500
Sample Rate(Max)(MSPS)500

生态计划

ADS5463IPFPADS5463IPFPG4ADS5463IPFPR
RoHSCompliantNot CompliantCompliant
Pb FreeNo

应用须知

  • Impact of sampling-clock spurs on ADC performance
    PDF, 1.2 Mb, 档案已发布: Jul 14, 2009
  • Q3 2009 Issue Analog Applications Journal
    PDF, 2.1 Mb, 档案已发布: Jul 14, 2009
  • Design Considerations for Avoiding Timing Errors during High-Speed ADC, LVDS Dat (Rev. A)
    PDF, 2.0 Mb, 修订版: A, 档案已发布: May 22, 2015
  • Why Use Oversampling when Undersampling Can Do the Job? (Rev. A)
    PDF, 1.2 Mb, 修订版: A, 档案已发布: Jul 19, 2013
  • Smart Selection of ADC/DAC Enables Better Design of Software-Defined Radio
    PDF, 376 Kb, 档案已发布: Apr 28, 2009
    This application report explains different aspects of selecting analog-to-digital and digital-to-analog data converters for Software-Defined Radio (SDR) applications. It also explains how ADS61xx ADCs and the DAC5688 from Texas Instruments fit properly for SDR designs.
  • Driving High-Speed ADCs: Circuit Topologies and System-Level Parameters (Rev. A)
    PDF, 327 Kb, 修订版: A, 档案已发布: Sep 10, 2010
    This application report discusses the performance-related aspects of passive and active interfaces at the analog input of high-speed pipeline analog-to-digital converters (ADCs). The report simplifies the many possibilities into two main categories: passive and active interface circuits. The first section of the report gives an overview of equivalent models of buffered and unbuffered ADC input cir
  • Phase Noise Performance and Jitter Cleaning Ability of CDCE72010
    PDF, 2.3 Mb, 档案已发布: Jun 2, 2008
    This application report presents phase noise data taken on the CDCE72010 jitter cleaner and synchronizer PLL device. The phase noise performance of the CDCE72010 depends on the phase noise of the reference clock VCXO clock and the CDCE72010 itself. This application report shows the phase noise performance at several of the most popular CDMA frequencies. This data helps the user to choose the rig
  • CDCE72010 as a Clocking Solution for High-Speed Analog-to-Digital Converters
    PDF, 424 Kb, 档案已发布: Jun 8, 2008
    Texas Instruments has recently introduced a family of devices suitable to meet the demands of high-speed high-IF sampling analog-to-digital converters (ADCs) such as the ADS5483 which is capable of sampling up to 135 MSPS. To realize the full potential of these high-performance devices the system must provide an extremely low phase noise clock source. The CDCE72010 clock synthesizer chip offers
  • A Glossary of Analog-to-Digital Specifications and Performance Characteristics (Rev. B)
    PDF, 425 Kb, 修订版: B, 档案已发布: Oct 9, 2011
    This glossary is a collection of the definitions of Texas Instruments' Delta-Sigma (О”ОЈ), successive approximation register (SAR), and pipeline analog-to-digital (A/D) converter specifications and performance characteristics. Although there is a considerable amount of detail in this document, the product data sheet for a particular product specification is the best and final reference.
  • Analog-to-Digital Converter Grounding Practices Affect System Performance (Rev. A)
    PDF, 69 Kb, 修订版: A, 档案已发布: May 18, 2015
  • Principles of Data Acquisition and Conversion (Rev. A)
    PDF, 132 Kb, 修订版: A, 档案已发布: Apr 16, 2015
  • Interleaving Analog-to-Digital Converters
    PDF, 64 Kb, 档案已发布: Oct 2, 2000
    It is tempting when pushing the limits of analog-to-digital conversion to consider interleaving two or more converters to increase the sample rate. However, such designs must take into consideration several possible sources of error.
  • What Designers Should Know About Data Converter Drift
    PDF, 95 Kb, 档案已发布: Oct 2, 2000
    Exactly how inaccurate will a change in temperature make an analog-to-digital or digital-to-analog converter? As designers are well aware, a 12-bit device may provide a much lower accuracy at its operating-temperature extremes, perhaps only to 9 or even 8 bits. But for lack of more precise knowledge, many play it safe (and expensive) and overspecify.

模型线

制造商分类

  • Semiconductors> Data Converters> Analog-to-Digital Converters (ADCs)> High Speed ADCs (>10MSPS)