11位65 MSPS ADC单通道，高IF，高带宽48-HTQFP -40至85
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This glossary is a collection of the definitions of Texas Instruments' Delta-Sigma (О”ОЈ), successive approximation register (SAR), and pipeline analog-to-digital (A/D) converter specifications and performance characteristics. Although there is a considerable amount of detail in this document, the product data sheet for a particular product specification is the best and final reference.
PDF, 64 Kb, 档案已发布: Oct 2, 2000
It is tempting when pushing the limits of analog-to-digital conversion to consider interleaving two or more converters to increase the sample rate. However, such designs must take into consideration several possible sources of error.
PDF, 327 Kb, 修订版: A, 档案已发布: Sep 10, 2010
This application report discusses the performance-related aspects of passive and active interfaces at the analog input of high-speed pipeline analog-to-digital converters (ADCs). The report simplifies the many possibilities into two main categories: passive and active interface circuits. The first section of the report gives an overview of equivalent models of buffered and unbuffered ADC input cir
PDF, 424 Kb, 档案已发布: Jun 8, 2008
Texas Instruments has recently introduced a family of devices suitable to meet the demands of high-speed high-IF sampling analog-to-digital converters (ADCs) such as the ADS5483 which is capable of sampling up to 135 MSPS. To realize the full potential of these high-performance devices the system must provide an extremely low phase noise clock source. The CDCE72010 clock synthesizer chip offers
PDF, 95 Kb, 档案已发布: Oct 2, 2000
Exactly how inaccurate will a change in temperature make an analog-to-digital or digital-to-analog converter? As designers are well aware, a 12-bit device may provide a much lower accuracy at its operating-temperature extremes, perhaps only to 9 or even 8 bits. But for lack of more precise knowledge, many play it safe (and expensive) and overspecify.
PDF, 2.3 Mb, 档案已发布: Jun 2, 2008
This application report presents phase noise data taken on the CDCE72010 jitter cleaner and synchronizer PLL device. The phase noise performance of the CDCE72010 depends on the phase noise of the reference clock VCXO clock and the CDCE72010 itself. This application report shows the phase noise performance at several of the most popular CDMA frequencies. This data helps the user to choose the rig
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PDF, 1.1 Mb, 档案已发布: Jan 11, 2012
The goal of this document is to introduce a wide range of theories and topics that are relevant tohigh-speed analog-to-digital converters (ADC). This document provides details on sampling theorydata-sheet specifications ADC selection criteria and evaluation methods clock jitter and other commonsystem-level concerns. In addition some end-users will want to extend the performance capabil
PDF, 376 Kb, 档案已发布: Apr 28, 2009
This application report explains different aspects of selecting analog-to-digital and digital-to-analog data converters for Software-Defined Radio (SDR) applications. It also explains how ADS61xx ADCs and the DAC5688 from Texas Instruments fit properly for SDR designs.
