Datasheet Texas Instruments OPA544T-1 — 数据表

高压，大电流运算放大器5-TO-220

数据表

PDF, 883 Kb, 档案已发布: Sep 27, 2000

从文件中提取

Lifecycle Status	Obsolete (Manufacturer has discontinued the production of the device)
Manufacture's Sample Availability	No

Replacement	OPA544T
Replacement Code	S

Additional Features	N/A
Approx. Price (US$)	9.09 \| 1ku
Architecture	FET
CMRR(Min)(dB)	90
CMRR(Typ)(dB)	106
GBW(Typ)(MHz)	1.4
Input Bias Current(Max)(pA)	100
Iq per channel(Max)(mA)	15
Iq per channel(Typ)(mA)	12
Number of Channels(#)	1
Offset Drift(Typ)(uV/C)	10
Operating Temperature Range(C)	-40 to 85
Output Current(Typ)(mA)	4000
Package Group	TO-220
Package Size: mm2:W x L (PKG)	See datasheet (TO-220)
Rail-to-Rail	No
Rating	Catalog
Slew Rate(Typ)(V/us)	8
Total Supply Voltage(Max)(+5V=5, +/-5V=10)	70
Total Supply Voltage(Min)(+5V=5, +/-5V=10)	20
Vos (Offset Voltage @ 25C)(Max)(mV)	5

RoHS	Not Compliant
Pb Free	No

Evaluation Modules & Boards: OPAMPEVM
Universal Operational Amplifier Evaluation Module
Lifecycle Status: Active (Recommended for new designs)

下载
Power Amplifier Stress and Power Handling Limitations
PDF, 55 Kb, 档案已发布: Sep 27, 2000
To achieve reliable power amplifier designs you must consider the stress on the amplifier compared to its power handling limitations. Power handling limits are specified by the Safe Operating Area (SOA) curves of the power amp. Stress on the amplifier depends on amplifier load and signal conditions which can be evaluated with straightforward techniques.
下载
Building your own Battery Simulator
PDF, 114 Kb, 档案已发布: Oct 14, 2013
Building your own Battery Simulator OPA544, bq2409x, bq2404x, bq2415x, bq2425x, bq2416x
下载
DC MOTOR SPEED CONTROLLER: Control a DC Motor without Tachometer Feedback
PDF, 50 Kb, 档案已发布: Sep 27, 2000
DC motor speed is often regulated with a closed-loop speed controller using tachometer feedback. It is possible, however, to control dc motor speed without tachometer feedback.
下载
MTTF, Failrate, Reliability, and Life Testing
PDF, 51 Kb, 档案已发布: Oct 4, 2000
At Burr-Brown, we characterize and qualify the reliability of our devices through high temperature life testing. The results of this testing are quantified with such values as MTTF and failure rate. This information can be very valuable when used for comparative purposes or applied to reliablility calculations. However, this information loses its worth if it is not precisely understood and appropr

系列: OPA544 (8)

OPA544T1, OPA544T 1