Datasheet Texas Instruments SNJ54AC00FK — 数据表

SN54AC00-DIE
www.ti.com SCHS391A – APRIL 2013 – REVISED NOVEMBER 2013 RAD-TOLERANT, QUADRUPLE 2-INPUT POSITIVE-NAND GATE
Check for Samples: SN54AC00-DIE FEATURES 1 2-V to 6-V VCC Operation
Inputs Accept Voltages to 6 V
Max tpd of 7 ns at 5 V DESCRIPTION/ORDERING INFORMATION
The SN54AC00-DIE device contains four independent 2-input NAND gates. Each gate performs the Boolean
function of Y = A B or Y = A + B in positive logic.
ORDERING INFORMATION (1) (1)
(2) PRODUCT PACKAGE
DESIGNATOR PACKAGE SN54AC00 TD Bare die in waffle pack (2) ORDERABLE PART NUMBER PACKAGE QUANTITY SN54AC00VTD1 100 SN54AC00VTD2 10 For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
Processing is per the Texas Instruments space production baseline and is in compliance with the Texas Instruments Quality Control
System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room temperature
only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not warranted. Visual
Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum. 1 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters. Copyright В© 2013, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are
tested unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters. SN54AC00-DIE …