Datasheet ADXL343 (Analog Devices) - 5

制造商Analog Devices
描述3-Axis, ±2 g/±4 g/±8 g/±16 g Digital Accelerometer
页数 / 页37 / 5 — ADXL343. Data Sheet. Parameter. Test Conditions/Comments. Min. Typ1. Max. …
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ADXL343. Data Sheet. Parameter. Test Conditions/Comments. Min. Typ1. Max. Unit

ADXL343 Data Sheet Parameter Test Conditions/Comments Min Typ1 Max Unit

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ADXL343 Data Sheet Parameter Test Conditions/Comments Min Typ1 Max Unit
TEMPERATURE Operating Temperature Range −40 +85 °C WEIGHT Device Weight 30 mg 1 The typical specifications shown are for at least 68% of the population of parts and are based on the worst case of mean ±1 σ, except for 0 g output and sensitivity, which represents the target value. For 0 g offset and sensitivity, the deviation from the ideal describes the worst case of mean ±1 σ. 2 Cross-axis sensitivity is defined as coupling between any two axes. 3 Bandwidth is the −3 dB frequency and is half the output data rate, bandwidth = ODR/2. 4 The output format for the 3200 Hz and 1600 Hz ODRs is different than the output format for the remaining ODRs. This difference is described in the Data Formatting of Upper Data Rates section. 5 Output data rates below 6.25 Hz exhibit additional offset shift with increased temperature, depending on selected output data rate. Refer to the Offset Performance at Lowest Data Rates section for details. 6 Self-test change is defined as the output (g) when the SELF_TEST bit = 1 (in the DATA_FORMAT register, Address 0x31) minus the output (g) when the SELF_TEST bit = 0. Due to device filtering, the output reaches its final value after 4 × τ when enabling or disabling self-test, where τ = 1/(data rate). The part must be in normal power operation (LOW_POWER bit = 0 in the BW_RATE register, Address 0x2C) for self-test to operate correctly. 7 Turn-on and wake-up times are determined by the user-defined bandwidth. At a 100 Hz data rate, the turn-on and wake-up times are each approximately 11.1 ms. For other data rates, the turn-on and wake-up times are each approximately τ + 1.1 in milliseconds, where τ = 1/(data rate). Rev. 0 | Page 4 of 36 Document Outline Features Applications General Description Functional Block Diagram Revision History Specifications Absolute Maximum Ratings Thermal Resistance Package Information ESD Caution Pin Configuration and Function Descriptions Typical Performance Characteristics Theory of Operation Power Sequencing Power Savings Power Modes Auto Sleep Mode Standby Mode Serial Communications SPI Preventing Bus Traffic Errors I2C Interrupts DATA_READY SINGLE_TAP DOUBLE_TAP Activity Inactivity FREE_FALL Watermark Overrun FIFO Bypass Mode FIFO Mode Stream Mode Trigger Mode Retrieving Data from FIFO Self-Test Register Map Register Definitions Register 0x00—DEVID (Read Only) Register 0x1D—THRESH_TAP (Read/Write) Register 0x1E, Register 0x1F, Register 0x20—OFSX, OFSY, OFSZ (Read/Write) Register 0x21—DUR (Read/Write) Register 0x22—Latent (Read/Write) Register 0x23—Window (Read/Write) Register 0x24—THRESH_ACT (Read/Write) Register 0x25—THRESH_INACT (Read/Write) Register 0x26—TIME_INACT (Read/Write) Register 0x27—ACT_INACT_CTL (Read/Write) ACT AC/DC and INACT AC/DC Bits ACT_x Enable Bits and INACT_x Enable Bits Register 0x28—THRESH_FF (Read/Write) Register 0x29—TIME_FF (Read/Write) Register 0x2A—TAP_AXES (Read/Write) Suppress Bit TAP_x Enable Bits Register 0x2B—ACT_TAP_STATUS (Read Only) ACT_x Source and TAP_x Source Bits Asleep Bit Register 0x2C—BW_RATE (Read/Write) LOW_POWER Bit Rate Bits Register 0x2D—POWER_CTL (Read/Write) Link Bit AUTO_SLEEP Bit Measure Bit Sleep Bit Wakeup Bits Register 0x2E—INT_ENABLE (Read/Write) Register 0x2F—INT_MAP (Read/Write) Register 0x30—INT_SOURCE (Read Only) Register 0x31—DATA_FORMAT (Read/Write) SELF_TEST Bit SPI Bit INT_INVERT Bit FULL_RES Bit Justify Bit Range Bits Register 0x32 to Register 0x37—DATAX0, DATAX1, DATAY0, DATAY1, DATAZ0, DATAZ1 (Read Only) Register 0x38—FIFO_CTL (Read/Write) FIFO_MODE Bits Trigger Bit Samples Bits 0x39—FIFO_STATUS (Read Only) FIFO_TRIG Bit Entries Bits Applications Information Power Supply Decoupling Mechanical Considerations for Mounting Tap Detection Threshold Link Mode Sleep Mode vs. Low Power Mode Offset Calibration Using Self-Test Data Formatting of Upper Data Rates Noise Performance Operation at Voltages Other Than 2.5 V Offset Performance at Lowest Data Rates Axes of Acceleration Sensitivity Layout and Design Recommendations Outline Dimensions Ordering Guide